A New Method for the Characterization of Electronic Components Immunity

Author

Ayed, Ala ; Dubois, Tristan ; Levant, Jean-Luc ; Duchamp, Genevieve

Author_Institution

Ecole Super. d´Electron. de l´Ouest, Angers, France

Volume

64

Issue

9

fYear

2015

fDate

Sept. 2015

Firstpage

2496

Lastpage

2503

Abstract

A new method for the characterization of integrated circuits immunity is presented in this paper. The substantial evolution of the resistive radio frequency injection probe (RFIP) test method is introduced. Measurement setup characterization is discussed along with the technique´s limitations. The method is also validated through different measurements, particularly on an analog-to-digital converter embedded in a microcontroller. RFIP measurement results are compared with results of other measurement techniques, including vector network analyzer, direct power injection, and differential RF probe.

Keywords

analogue-digital conversion; frequency measurement; integrated circuit testing; microcontrollers; sensors; RFIP measurement; RFIP test method; analog-to-digital converter; differential RF probe; direct power injection; electronic component; integrated circuit immunity; microcontroller; resistive radiofrequency injection probe test method; vector network analyzer; Current measurement; Frequency measurement; Impedance; Probes; Radio frequency; Scattering parameters; Transmission line measurements; Analog-to-digital converter (ADC); electromagnetic compatibility (EMC); electromagnetic interference (EMI); immunity measurement; integrated circuit (IC); radio frequency injection probe (RFIP) technique; radio frequency injection probe (RFIP) technique.;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2015.2412014

Filename

7072506