• DocumentCode
    607424
  • Title

    Automated segmentation of a ventricle boundary from CT brain image based on naïve Bayes classifier

  • Author

    Clangphukhieo, B. ; Aimmanee, P. ; Uyyanonvara, Bunyarit

  • Author_Institution
    Siridhorn Int. Inst. of Technol., Thammasat Univ., Pathumthani, Thailand
  • fYear
    2012
  • fDate
    3-5 Dec. 2012
  • Firstpage
    1168
  • Lastpage
    1173
  • Abstract
    The ventricle is filled with cerebrospinal fluid (CSF) in the brain. Some brain diseases are caused by changing of the ventricle shape or volume. The ventricle shape and volume are used to diagnose patients who have brain diseases. This paper proposes an algorithm of digital image processing for segmentation of a ventricle from CT brain images. The process starts with normalizing the CT brain images and extracts the region of interest using profile of gray level. In the segmentation step, we apply Bayesian segmentation to classify intensities into 3 classes: white matter, gray matter, and CSF. The proposed algorithm segments the area of CSF that is obtained by the posterior probability from Bayes´ rule. Finally, the ventricle is evaluated with the relatively ground truth from a neurologists. Our experimental results from the proposed algorithm reveal a low error of 3.14% and a standard deviation of 1.41.
  • Keywords
    Bayes methods; brain; computerised tomography; diseases; feature extraction; image classification; image segmentation; medical image processing; Bayes rule; Bayesian segmentation; CSF; CT brain image; brain diseases; cerebrospinal fluid; digital image processing; gray level profile; gray matter; intensity classification; naïve Bayes classifier; posterior probability; region of interest extraction; ventricle boundary automated segmentation; ventricle shape; ventricle volume; white matter; CT Brain; Image Segmentation; Naïve Bayesian; Ventricle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing and Convergence Technology (ICCCT), 2012 7th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4673-0894-6
  • Type

    conf

  • Filename
    6530513