Title :
Compact Model Council´s standard circuit simulator interface for reliability modeling
Author_Institution :
Mentor Graphics, Cairo, Egypt
Abstract :
The Compact Model Council (CMC) commissioned a subcommittee to develop a standard in the area of reliability-induced aging modeling and simulation. The subcommittee proposed requirements for a standard application programming interface (API) for aging simulation. This paper presents the requirements of a simulation framework for reliability analysis of circuits in the SPICE environment.
Keywords :
SPICE; ageing; application program interfaces; circuit reliability; circuit simulation; standards; API; CMC; Compact Model Council; SPICE environment; aging modeling; aging simulation; reliability modeling; standard application programming interface; standard circuit simulator interface; Aging; Analytical models; Degradation; Integrated circuit modeling; Integrated circuit reliability; Mathematical model; aging; cmc; compact model council; reliability;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2013.6531945
