Title :
Technology scaling and reliability challenges in the multicore era
Author :
Huard, Vincent ; Cacho, F. ; Federspiel, Xavier
Author_Institution :
STMicroelectron., Crolles, France
Abstract :
This work provides elements to highlight the reliability challenges related to the technology scaling in the multicore era. Through main milestones including device reliability scaling models, single-core scaling model and multicore chip organization and scaling models, the reliability impact on the speedup potential of multiprocessors for a set of parallel real workloads is assessed. The main conclusion of this study is to highlight the fact that the “free lunch” for overdrive conditions is soon to be over.
Keywords :
integrated circuit modelling; integrated circuit reliability; microprocessor chips; multiprocessing systems; device reliability scaling model; microprocessor; multicore chip organization; multicore era; multiprocessor; parallel real workload set; single-core scaling model; technology scaling; Benchmark testing; Degradation; Multicore processing; Performance evaluation; Reliability; Threshold voltage; Topology; AVS; DVFS; aged models; failure rate; gate-level models; guardband; microprocessor; multicore; parallel workload; product qualification; reliability; wireless application;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2013.6531975