DocumentCode :
608264
Title :
Models and methods for determining storage reliability
Author :
Mense, A.T. ; Gullo, L. ; Thomas, Julian ; Shedlock, P.
Author_Institution :
Raytheon Missile Syst., Tucson, AZ, USA
fYear :
2013
fDate :
14-18 April 2013
Abstract :
Current dormant storage reliability prediction methods are out dated and may not represent current technology. Some customers are concerned the data supporting the storage reliability prediction method are too old and not reflective of the current technology capability. This paper provides an approach and documents the results of an ongoing case study that uses a binary logistic regression (BLR) model (both classical and Bayesian) to assess recent system failures during non-operating storage and non-operating transportation. Both non-operational and operational system failures were considered in the analysis to determine presence of wear-out mechanisms and degradation, which may cause operational failures. As described in IEEE Std 1413 [1], the usefulness of a reliability prediction is based on how the prediction is developed and how well the prediction is prepared, interpreted, and applied. Reliability predictions are affected by the accuracy and completeness of the information provided to perform the prediction and the methods used to complete the prediction. The benefit of the BLR model is that it provides consistent and repeatable results that provide increased customer confidence in products.
Keywords :
Bayes methods; failure analysis; integrated circuit reliability; regression analysis; BLR model; Bayesian system; IEEE Std 1413; binary logistic regression; dormant storage reliability; nonoperating storage; nonoperating transportation; nonoperational system; storage reliability prediction; wear-out mechanisms; Analytical models; Data models; Degradation; Logistics; Predictive models; Reliability engineering; Binary Logistic Regression (BLR); FRACAS; Storage Reliability; field data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2013.6532083
Filename :
6532083
Link To Document :
بازگشت