DocumentCode :
608277
Title :
Reliable, low-power super-lattice phase-change memory without melting and write-pulse down slope
Author :
Johguchi, Koh ; Egami, T. ; Takeuchi, Ken
Author_Institution :
Dept. of Electr., Electron., & Commun. Eng., Chuo Univ., Tokyo, Japan
fYear :
2013
fDate :
14-18 April 2013
Abstract :
A reliable super-lattice phase change memory (SL-PCM) is investigated. Since the conductivity of SLPCM is changed by Ge flip-flop, <; 300 μA write-current is achieved. Additionally, pulse slope is found to be unnecessary, in fact, too long falling edge has negative effects for SET, since SL-PCM does not melt. As a result, due to small write-current, SL-PCM solves the reliability problems about thermal disturb and electro-migration and provides a potential for next-generation non-volatile memories.
Keywords :
electromigration; elemental semiconductors; flip-flops; germanium; integrated circuit reliability; phase change memories; Ge; Ge flip-flop; SET; SL-PCM; electromigration; low-power phase-change memory; next-generation nonvolatile memories; pulse slope; reliability; small write-current; super-lattice phase change memory; thermal disturb; Conductivity; Electrical resistance measurement; Phase change materials; Phase change memory; Reliability; Resistance; Temperature measurement; chalcogenide; phase change memory; super-lattice;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2013.6532096
Filename :
6532096
Link To Document :
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