• DocumentCode
    608292
  • Title

    A comprehensive soft error analysis tool for core networking system

  • Author

    Haihong Zhu ; Wong, Rita ; ShiJie Wen

  • Author_Institution
    Cisco Syst., San Jose, CA, USA
  • fYear
    2013
  • fDate
    14-18 April 2013
  • Abstract
    In this paper, we developed a comprehensive single-event upset (SEU) analysis tool. To achieve this goal we start by defining the SEU mitigation strategy as a combination of chip level methods and system level methods. Given a particular SEU chip level and/or system level mitigation choice, we propose first categorizing the SEU Failure In Time (FIT) into different time window bins based on SEU recovery time. Then we analyze the impact of each mitigation strategy, results in the FIT value change in each bin. This tool enables the engineers to do the SEU mitigation design in early design phase. A user-friendly Excel format is also developed to make the complicated model easy to use. The system can be modeled using the tool at an early stage to support design decisions and trade-offs related to potentially costly mitigation strategies.
  • Keywords
    integrated circuit design; integrated circuit reliability; radiation hardening (electronics); FIT; SEU analysis tool; SEU mitigation strategy; core networking system; failure in time; single-event upset; soft error analysis tool; user-friendly Excel format; Error analysis; Error correction codes; Field programmable gate arrays; Monitoring; Random access memory; Reliability; Single event upsets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4799-0112-8
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2013.6532111
  • Filename
    6532111