• DocumentCode
    608315
  • Title

    Scattering from coated cracks for sub-millimeter wave applications by KP method

  • Author

    Ghalamkari, B. ; Tavakoli, A. ; Dehmollaian, M.

  • Author_Institution
    Dept. of Electr. Eng., AmirKabir Univ. of Technol., Tehran, Iran
  • fYear
    2012
  • fDate
    24-26 Dec. 2012
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    The Kobayashi Potential (KP) is an analytical technique used for solving mixed boundary geometrical problems. In this paper scattering by a 2D dielectric filled rectangular crack on a ground plane, coated by a dielectric layer for TM case is studied using KP method. The fields in three distinctive regions of the geometry are expressed in terms of Bessel eigenfunctions. The problem is reduced to a system of equations involving summations with an infinite number of unknown coefficients. By applying Weber-Schafheitlin discontinuous integrals, the summations truncated with high numerical accuracy. We employ finite element method (FEM) for validation of our method. Finally, the influence of coating dielectric layer is investigated on the scattered field. This technique could open practical means for non destructive testing in Terahertz frequency region.
  • Keywords
    Bessel functions; cracks; eigenvalues and eigenfunctions; finite element analysis; nondestructive testing; scattering; 2D dielectric filled rectangular crack; Bessel eigenfunctions; FEM; Kobayashi potential method; Weber-Schafheitlin discontinuous integrals; coated cracks; finite element method; mixed boundary geometrical problems; nondestructive testing; scattering; submillimeter wave applications; terahertz frequency region; 2D coated crack; Kobayashi Potential; Millimeter wave and Terahertz; Plane wave scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Millimeter -Wave and Terahertz Technologies (MMWaTT), 2012 Second Conference on
  • Conference_Location
    Tehran
  • ISSN
    2157-0965
  • Print_ISBN
    978-1-4673-4954-3
  • Type

    conf

  • DOI
    10.1109/MMWaTT.2012.6532160
  • Filename
    6532160