UTP cable length measuring instrument feturing TI´s interface circuits

Author

Kjosev, J. ; Cvetkovski, D. ; Popovikj, A.

Author_Institution

Fac. of Electr. Eng., SS Cyril & Methodius Univ., Skopje, Macedonia

fYear

2012

fDate

13-14 Sept. 2012

Firstpage

109

Lastpage

113

Abstract

Time Domain Reflectometry (TDR) diagnostic features of Ethernet physical transceiver chips are explored for evaluating their applicability for construction of an UTP-cable length-measurement and diagnostic instrument. The instrument is mainly intended as an aid during installation and for post-installation documentation. Dithering method is applied for length measurement to increase the resolution, based on physical patch-cable switchover and/or discrete component cable emulation and/or programmable delay-line delay-dithering. A practical experiment with length dithering using cable patches confirms the feasibility of the idea.

Keywords

time-domain reflectometry; transceivers; twisted pair cables; Ethernet physical transceiver chips; UTP cable length; UTP-cable length-measurement; cable patches; diagnostic instrument; discrete component cable emulation; dithering method; interface circuits; physical patch-cable switchover; post-installation documentation; time domain reflectometry diagnostic features;

fLanguage

English

Publisher

ieee

Conference_Titel

Education and Research Conference (EDERC), 2012 5th European DSP

Conference_Location

Amsterdam

Print_ISBN

978-1-4673-4595-8

Electronic_ISBN

978-1-4673-4595-8

Type

conf

DOI

10.1109/EDERC.2012.6532236

Filename

6532236