Title :
Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty
Author :
Limbrick, Daniel B. ; Mahatme, N.N. ; Robinson, William H. ; Bhuva, B.L.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Strategies to mitigate soft errors in combinational logic have resulted in large performance penalties and increases in design time. This study alleviates these issues by using standard cells to selectively harden vulnerable nodes in combinational logic. Results indicate that replacing two-input gates with four-input equivalents reduces pulse widths by 5%-20% with less than 1% power overhead. Additionally, this paper demonstrates reliability gains that can be made at the synthesis level under tight performance constraints.
Keywords :
combinational circuits; integrated circuit design; integrated circuit reliability; combinational logic; four-input gates; minimal performance penalty; performance constraints; reliability-aware synthesis; soft error mitigation; standard cells; Capacitance; Delay; Integrated circuit reliability; MOSFETs; Transient analysis; Combinational logic; pulse width; reliability-aware synthesis; single event transient; soft error;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2240699