DocumentCode :
609281
Title :
Effect of electron beam irradiation on electrodeposited nanostructured copper selenide thin films
Author :
Dhasade, S.S. ; Kadam, A.B. ; Thombare, J.V. ; Fulari, V.J.
Author_Institution :
Vidnyan Mahavidyalaya, Sangola, India
fYear :
2013
fDate :
10-12 April 2013
Firstpage :
463
Lastpage :
465
Abstract :
Copper selenide nanorods fused at both ends with various diameters and lengths were obtained by irradiating electrodeposited thin films. The irradiation dose can be used to control the diameter of the electrodeposited nanorods to within the range of 70-100 nm. This paper reports the effect of high-energy (7 MeV) electron beam irradiation on the optical properties of CuSe thin films grown by conventional electrodeposition method on steel substrates. Upon irradiation the band gap energy increased from a value of 2.82 eV to 3.03 eV where as there is a drastic change in their morphology. The grain size increases with electron beam irradiation and material become poor crystalline. Similar results were observed in the X-ray diffraction studies, where peak intensity decreases with electron beam irradiation.
Keywords :
X-ray diffraction; copper compounds; electrodeposits; electron beam effects; energy gap; grain size; nanofabrication; nanorods; semiconductor growth; semiconductor thin films; CuSe; X-ray diffraction; band gap energy; crystalline; diameter control; electrodeposited nanorod fusion; electrodeposited nanostructured copper selenide thin film; electron beam irradiation effect; electron volt energy 2.82 eV to 3.03 eV; grain size; steel substrate; wavelength 70 nm to 100 nm; Copper; Electron beams; Morphology; Optical films; Optical sensors; Photonic band gap; Radiation effects; Electrodeposition; diffusion; irradiation; nanoparticles; optical properties; semiconductors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Efficient Technologies for Sustainability (ICEETS), 2013 International Conference on
Conference_Location :
Nagercoil
Print_ISBN :
978-1-4673-6149-1
Type :
conf
DOI :
10.1109/ICEETS.2013.6533428
Filename :
6533428
Link To Document :
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