• DocumentCode
    609628
  • Title

    A high effieciency DC/DC boost regulator with adaptive off/on-time control

  • Author

    Chen-Yu Wang ; Jhih-Sian Guo ; Chi-Yuan Huang ; Chien-Hung Tsai

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2013
  • fDate
    22-24 April 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An inductor switching DC/DC boost regulator with adaptive off/on time (AOOT) control is proposed in this paper. This system works with adaptive-off-time control in CCM while adaptive-on-time control in DCM. The burden caused by the switching frequency variation is reduced due to the quasi-fixed frequency switching by adaptive-off-time modulation under heavy-load condition. In DCM, adaptive-on-time takes over the operation and improves the power efficiency under light-load condition. In another way, an on-chip sense-FET current sensor is used to decrease the conduction loss caused by the conventional sensing resistor on power stage. The AOOT control boost regulator was implemented with a 0.25 μm high voltage (HV) CMOS process. For conversion specification of 5 V to 12V with a 0~300mA load range, peak efficiency of 92.5% is achieved. Measurement results show that the switching frequency keeps constant at 950 kHz in CCM.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; adaptive control; electric sensing devices; switching convertors; AOOT control boost regulator; CCM; CMOS; DC/DC boost regulator; DCM; adaptive off/on-time control; adaptive-off-time control; adaptive-off-time modulation; adaptive-on-time control; conduction loss; current 0 mA to 300 mA; frequency 950 kHz; inductor switching; on-chip sense-FET current sensor; quasi-fixed frequency switching; sensing resistor; size 0.25 mum; voltage 12 V; voltage 5 V; Manganese; Regulators; Resistors; Sensors; Switches; Switching frequency; Adaptive off/on-time; Boost; DC/DC converter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4673-4435-7
  • Type

    conf

  • DOI
    10.1109/VLDI-DAT.2013.6533804
  • Filename
    6533804