Title : 
A high effieciency DC/DC boost regulator with adaptive off/on-time control
         
        
            Author : 
Chen-Yu Wang ; Jhih-Sian Guo ; Chi-Yuan Huang ; Chien-Hung Tsai
         
        
            Author_Institution : 
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
         
        
        
        
        
        
            Abstract : 
An inductor switching DC/DC boost regulator with adaptive off/on time (AOOT) control is proposed in this paper. This system works with adaptive-off-time control in CCM while adaptive-on-time control in DCM. The burden caused by the switching frequency variation is reduced due to the quasi-fixed frequency switching by adaptive-off-time modulation under heavy-load condition. In DCM, adaptive-on-time takes over the operation and improves the power efficiency under light-load condition. In another way, an on-chip sense-FET current sensor is used to decrease the conduction loss caused by the conventional sensing resistor on power stage. The AOOT control boost regulator was implemented with a 0.25 μm high voltage (HV) CMOS process. For conversion specification of 5 V to 12V with a 0~300mA load range, peak efficiency of 92.5% is achieved. Measurement results show that the switching frequency keeps constant at 950 kHz in CCM.
         
        
            Keywords : 
CMOS integrated circuits; DC-DC power convertors; adaptive control; electric sensing devices; switching convertors; AOOT control boost regulator; CCM; CMOS; DC/DC boost regulator; DCM; adaptive off/on-time control; adaptive-off-time control; adaptive-off-time modulation; adaptive-on-time control; conduction loss; current 0 mA to 300 mA; frequency 950 kHz; inductor switching; on-chip sense-FET current sensor; quasi-fixed frequency switching; sensing resistor; size 0.25 mum; voltage 12 V; voltage 5 V; Manganese; Regulators; Resistors; Sensors; Switches; Switching frequency; Adaptive off/on-time; Boost; DC/DC converter;
         
        
        
        
            Conference_Titel : 
VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
         
        
            Conference_Location : 
Hsinchu
         
        
            Print_ISBN : 
978-1-4673-4435-7
         
        
        
            DOI : 
10.1109/VLDI-DAT.2013.6533804