DocumentCode :
609650
Title :
Design of thermal management unit with vertical throttling scheme for proactive thermal-aware 3D NoC systems
Author :
Kun-Chih Chen ; Shu-Yen Lin ; An-Yeu Wu
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2013
fDate :
22-24 April 2013
Firstpage :
1
Lastpage :
4
Abstract :
The three-dimensional Network-on-Chip (3D NoC) has been proposed to solve the complex on-chip communication issues. However, the thermal problems become more exacerbated because of the larger power density and the heterogeneous thermal conductance in different silicon layer of 3D NoC. To regulate the system temperature, the Dynamic Thermal Management (DTM) techniques will be triggered when the device is thermal-emergent. However, these kinds of reactive DTM schemes result in significant system performance degradation. In this paper, we propose a proactive DTM with vertical throttling (PDTM-VT) scheme, which is controlled by the distributed Thermal Management Unit (TMU) of each NoC node. Based on the expected temperature resulted from the proposed thermal prediction model, the TMU can early control the temperature of the thermal-emergent device. The experimental results show that the proposed thermal prediction model has less than 0.25% prediction error against actual temperature measurement within 50ms. Besides, the PDTM-VT can reduce 11.84%~23.18% thermal-emergent nodes and improve 0.47%~47.90% network throughput.
Keywords :
network-on-chip; temperature control; thermal management (packaging); 3D network-on-chip; TMU; distributed thermal management unit; dynamic thermal management; heterogeneous thermal conductance; on-chip communication; proactive DTM; proactive thermal-aware 3D NoC system; reactive DTM; silicon layer; system performance degradation; system temperature regulation; temperature control; thermal prediction model; thermal-emergent device; vertical throttling scheme; Computational modeling; Mathematical model; Predictive models; Temperature control; Temperature sensors; Thermal management; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-4435-7
Type :
conf
DOI :
10.1109/VLDI-DAT.2013.6533826
Filename :
6533826
Link To Document :
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