Title :
Novel test analysis to improve structural coverage — A commercial experiment
Author :
Wen Chen ; Wang, Lingfeng ; Bhadra, Jayanta ; Abadir, M.S.
Author_Institution :
Univ. of California, Santa Barbara, Santa Barbara, CA, USA
Abstract :
Novel tests are important in simulation-based functional verification because they provide coverage of difficult-to-verify corners. In this work, we did an experimental study on how to learn from the novel tests to help improve structural coverage in functional verification. A feature-based learning methodology is proposed to diagnose the reasons why a novel test contributes to coverage of a target block. The extracted rules can be used as constraints to improve test generation. Our experiments were conducted based on a simulation environment for verifying a commercial dual-thread low-power processor core. In one case, we improved the toggle coverage of a block in load store unit to 100%, which was otherwise difficult without learning.
Keywords :
circuit simulation; integrated circuit testing; learning (artificial intelligence); low-power electronics; microprocessor chips; commercial dual-thread low-power processor core; difficult-to-verify corner; feature-based learning methodology; microprocessor; simulation-based functional verification testing; structural coverage improvement; target block coverage; test generation; Design automation; Engines; Feature extraction; Generators; Microprocessors; Registers; Solid modeling;
Conference_Titel :
VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-4435-7
DOI :
10.1109/VLDI-DAT.2013.6533851