DocumentCode
609690
Title
The implementation of DES circuit on via-programmable structured ASIC architecture VPEX3
Author
Hori, R. ; Ueoka, T. ; Otani, Tetsuo ; Yoshikawa, Masatoshi ; Fujino, T.
Author_Institution
Dept. of VLSI Syst. Design, Ritsumeikan Univ., Kusatsu, Japan
fYear
2013
fDate
22-24 April 2013
Firstpage
1
Lastpage
4
Abstract
The exponential increase of photo-mask cost is a serious problem in the SoC fabrication. We have developed the Structured ASIC architecture named VPEX3, which can program logic functions using only three via layers. In the VPEX3 architecture, the logic element (LE) composed of EXOR and NOT gate can realize 22 logic functions. This architecture is effective to reduce the NRE cost for low-volume ASICs, because an intended logic function can be implemented rapidly by only changing three masks. A dedicated CAD system for VPEX3 architecture had been developed in our laboratory, and combinational circuits had been successfully operated on the test chip. In this paper, we propose the novel clock network architecture for implementing sequential logic circuit. Furthermore, we demonstrate the chip design of DES cryptographic circuit using this clock network and our inhouse dedicated CAD system.
Keywords
clocks; combinational circuits; cryptography; integrated circuit design; integrated circuit testing; logic CAD; logic gates; logic testing; masks; programmable circuits; sequential circuits; system-on-chip; DES cryptographic circuit design; EXOR gate; LE; NOT gate; NRE cost; SoC fabrication; chip testing; clock network; clock network architecture; combinational circuit; data encryption standard; in-house dedicated CAD system; logic element; logic function program; photomask costing; sequential logic circuit; via-programmable structured ASIC architecture VPEX3; Application specific integrated circuits; Clocks; Computer architecture; Design automation; Logic functions; Logic gates; Wiring; Exclusive-or; middle-volume-production; structard ASIC; via configurable; via programmable;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4673-4435-7
Type
conf
DOI
10.1109/VLDI-DAT.2013.6533867
Filename
6533867
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