DocumentCode
609775
Title
Analysis of solder joint Edge Effect in Acoustic Micro Imaging of microelectronic packages: A preliminary study
Author
Lee, Chean ; Zhang, Guang-Ming ; Harvey, David
Author_Institution
General Engineering Research Institute, Liverpool John Moores University, James Parson Building, Byrom Street, L3 3AF
fYear
2012
fDate
17-20 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
A guaranteed occurrence when using Acoustic Micro Imaging, the phenomena called Edge Effect is not clearly understood. The widely accepted reliance on scatter theory to explain edge effect is challenged in this study. The edge effect of solder joints is investigated using finite element modeling. Simulation strategies for reducing computational load are proposed. A methodology to characterize acoustic data for edge effect analysis is further developed. Results show that the relationship between scatter theory and edge effect is not straight forward.
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2012 4th
Conference_Location
Amsterdam, Netherlands
Print_ISBN
978-1-4673-4645-0
Type
conf
DOI
10.1109/ESTC.2012.6542079
Filename
6542079
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