DocumentCode
610167
Title
Analysis of the tolerance area parameters REC based on technological area scattering
Author
Krepych, S. ; Stakhiv, P. ; Spivak, I.
Author_Institution
Comput. Sci. Dept., Ternopil Nat. Econ. Univ., Ternopil, Ukraine
fYear
2013
fDate
19-23 Feb. 2013
Firstpage
179
Lastpage
180
Abstract
In the process of production and operation of electronic devices often output values REC elements differ from nominal. Therefore, during devices designing it´s necessary to consider tolerances on the parameters of the elements. Tolerance area of parameter values estimation can be achieved by entering of the REC in this area ellipsoid scattering.
Keywords
S-parameters; tolerance analysis; REC elements; area ellipsoid scattering; electronic devices; parameter values estimation; technological area scattering; tolerance area; Covariance matrices; Ellipsoids; Equations; Estimation; Manufacturing; Mathematical model; Scattering; ellipsoid scattering; matrix configuration; tolerance area; tolerance ellipsoid;
fLanguage
English
Publisher
ieee
Conference_Titel
Experience of Designing and Application of CAD Systems in Microelectronics (CADSM), 2013 12th International Conference on the
Conference_Location
Polyana Svalyava
Print_ISBN
978-1-4673-6461-4
Type
conf
Filename
6543231
Link To Document