Title :
Expertly-probabilistic method of assessing alectronic devices during their carriage
Author_Institution :
Dept. of Electron. Inf. & Comput. Technol., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Expertly-probabilistic method of assessing electronic devices during their carriage based on the well known Bayes theorem.
Keywords :
Bayes methods; expert systems; probability; Bayes theorem; electronic device assessment; expertly-probabilistic method; Automobiles; Marine vehicles; Probability; Rockets; Vibrations; Bayes´ theorem; critical condition; electronic devices (ED); energy spectrum; expertly-probabilistic system; experts; priory and statistic information; probability; vibration;
Conference_Titel :
Experience of Designing and Application of CAD Systems in Microelectronics (CADSM), 2013 12th International Conference on the
Conference_Location :
Polyana Svalyava
Print_ISBN :
978-1-4673-6461-4
