DocumentCode
610176
Title
Expertly-probabilistic method of assessing alectronic devices during their carriage
Author
Myhaylo, M.
Author_Institution
Dept. of Electron. Inf. & Comput. Technol., Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2013
fDate
19-23 Feb. 2013
Firstpage
247
Lastpage
248
Abstract
Expertly-probabilistic method of assessing electronic devices during their carriage based on the well known Bayes theorem.
Keywords
Bayes methods; expert systems; probability; Bayes theorem; electronic device assessment; expertly-probabilistic method; Automobiles; Marine vehicles; Probability; Rockets; Vibrations; Bayes´ theorem; critical condition; electronic devices (ED); energy spectrum; expertly-probabilistic system; experts; priory and statistic information; probability; vibration;
fLanguage
English
Publisher
ieee
Conference_Titel
Experience of Designing and Application of CAD Systems in Microelectronics (CADSM), 2013 12th International Conference on the
Conference_Location
Polyana Svalyava
Print_ISBN
978-1-4673-6461-4
Type
conf
Filename
6543251
Link To Document