Title :
Invited tutorial: MEMS: Driving advances in electronic devices
Author_Institution :
Micron Technol., Inc., Boise, ID, USA
Abstract :
The goal of the course is to give you a brief overview of MEMS technologies by covering packaging, reliability, simulation, and testing. We will venture into recent developments like Sensor Fusion, Integrated CMOS-MEMS, and BioMEMS. You will gain an in-depth knowledge of challenges and opportunities associated with bringing MEMS-based products to market through the course´s focus on two key topics: (1) MEMS Packaging - You will learn packaging concepts for MEMS devices while reviewing assembly and packaging procedures such as structural release, cleaning, encapsulation, and testing. The tutorial will also cover various challenges associated with packaging and testing MEMS. (2) MEMS Reliability - This tutorial will review MEMS reliability issues and associated analysis/simulation techniques. MEMS reliability requires a broad understanding of physics, material science, and mechanics in order to handle the challenges during research, development, and productization.
Keywords :
CMOS integrated circuits; assembling; integrated circuit reliability; integrated circuit testing; micromechanical devices; packaging; sensor fusion; MEMS packaging; MEMS reliability; MEMS testing; analysis technique; assembly procedure; bioMEMS; electronic device; integrated CMOS-MEMS; material science; mechanics; packaging procedure; physics; sensor fusion; simulation technique; structural releasing; Abstracts; Micromechanical devices; Reliability; Testing;
Conference_Titel :
Microelectronics and Electron Devices (WMED), 2013 IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-6034-0
DOI :
10.1109/WMED.2013.6544496