Title :
Optical, structural and morphological characterization of ZnS thin films grown by RF sputtering
Author :
Mukherjee, Chhandak ; Rajiv, K. ; Gupta, Puneet ; Sinha, Arun Kumar ; Porwal, S. ; Abhinandan, L.
Author_Institution :
Mech. & Opt. Support Sect., Raja Ramanna Centre for Adv. Technol., Indore, India
Abstract :
Effect of thickness on transmittance, structure, photoluminescence and surface morphology of sputtered ZnS thin films are studied. Band-gap increases with decreasing thickness. GIXRD shows cubic phase. Crystallinity increases with thickness. Photoluminescence shows peak at 475nm.
Keywords :
X-ray diffraction; crystal structure; energy gap; photoluminescence; sputter deposition; surface morphology; thin films; zinc compounds; GIXRD; RF sputtering; ZnS; band gap; crystallinity; cubic phase; photoluminescence; surface morphology; thickness effect; thin films; transmittance; wavelength 475 nm;
Conference_Titel :
Fiber Optics and Photonics (PHOTONICS), 2012 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4673-4718-1
