• DocumentCode
    610531
  • Title

    Optical, structural and morphological characterization of ZnS thin films grown by RF sputtering

  • Author

    Mukherjee, Chhandak ; Rajiv, K. ; Gupta, Puneet ; Sinha, Arun Kumar ; Porwal, S. ; Abhinandan, L.

  • Author_Institution
    Mech. & Opt. Support Sect., Raja Ramanna Centre for Adv. Technol., Indore, India
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Effect of thickness on transmittance, structure, photoluminescence and surface morphology of sputtered ZnS thin films are studied. Band-gap increases with decreasing thickness. GIXRD shows cubic phase. Crystallinity increases with thickness. Photoluminescence shows peak at 475nm.
  • Keywords
    X-ray diffraction; crystal structure; energy gap; photoluminescence; sputter deposition; surface morphology; thin films; zinc compounds; GIXRD; RF sputtering; ZnS; band gap; crystallinity; cubic phase; photoluminescence; surface morphology; thickness effect; thin films; transmittance; wavelength 475 nm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fiber Optics and Photonics (PHOTONICS), 2012 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-4718-1
  • Type

    conf

  • Filename
    6545504
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=610531