Title :
SNR metric and crosstalk in color image sensor of small size pixel
Author :
JungChak Ahn ; Bumsuk Kim ; Kyungho Lee ; Sangjun Choi ; Heegeun Jeong ; Hongki Kim ; Hiroshige, G. ; Chi-Young Choi ; Duckhyung Lee
Author_Institution :
Syst. LSI Div., Samsung Electron. Co., Ltd., Yongin, South Korea
Abstract :
According to the high resolution trend in CMOS image sensor, pixel size is shrinking continuously towards and beyond 1.0 μm and reaching technical barrier to get the required performance. To achieve high SNR´s in both low and high illumination, while high sensitivity and high full well capacity are essential but limited by pixel size of around 1.0 μm, reduction of crosstalk is more efficient way, which makes `effectively´ sensitivity and full well capacity higher. In this paper, successful demonstration of ultralow crosstalk high SNR pixel will be presented.
Keywords :
CMOS image sensors; crosstalk; image colour analysis; CMOS image sensor; SNR metric; color image sensor; crosstalk; Crosstalk; Dynamic range; Image color analysis; Image quality; Lighting; Sensitivity; Signal to noise ratio;
Conference_Titel :
VLSI Technology, Systems, and Applications (VLSI-TSA), 2013 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-3081-7
Electronic_ISBN :
978-1-4673-6422-5
DOI :
10.1109/VLSI-TSA.2013.6545641
