DocumentCode
612
Title
A Closed-Form Charge Control Model for the Threshold Voltage of Depletion- and Enhancement-Mode AlGaN/GaN Devices
Author
Wang, Zhen ; Zhang, Boming ; Chen, Weijie ; Li, Zuyi
Author_Institution
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronics Science and Technology of China, Chengdu, China
Volume
60
Issue
5
fYear
2013
fDate
May-13
Firstpage
1607
Lastpage
1612
Abstract
A closed-form charge control model (CCM) for threshold voltage
of single-heterojunction (AlGaN/GaN) devices is developed. The CCM reveals the mechanisms of how the space charges across the barrier of a heterojunction deplete or enhance 2-D electron gas. The
of both depletion- and enhancement-mode heterostructure field-effect transistors may be calculated through this model. Considering the strained and relaxed states, and surface states, the calculated results for
are in good agreement with simulation results. The generalized form for CCM may have wide applications for theoretical-based design for
of AlGaN/GaN devices.
Keywords
Aerospace electronics; Aluminum gallium nitride; Gallium nitride; HEMTs; Heterojunctions; Space charge; Threshold voltage; AlGaN/GaN; charge control model (CCM); heterostructure field effect transistor (HFET); threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2252466
Filename
6490040
Link To Document