• DocumentCode
    612
  • Title

    A Closed-Form Charge Control Model for the Threshold Voltage of Depletion- and Enhancement-Mode AlGaN/GaN Devices

  • Author

    Wang, Zhen ; Zhang, Boming ; Chen, Weijie ; Li, Zuyi

  • Author_Institution
    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronics Science and Technology of China, Chengdu, China
  • Volume
    60
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    1607
  • Lastpage
    1612
  • Abstract
    A closed-form charge control model (CCM) for threshold voltage (V_{\\rm th}) of single-heterojunction (AlGaN/GaN) devices is developed. The CCM reveals the mechanisms of how the space charges across the barrier of a heterojunction deplete or enhance 2-D electron gas. The V_{\\rm th} of both depletion- and enhancement-mode heterostructure field-effect transistors may be calculated through this model. Considering the strained and relaxed states, and surface states, the calculated results for V_{\\rm th} are in good agreement with simulation results. The generalized form for CCM may have wide applications for theoretical-based design for V_{\\rm th} of AlGaN/GaN devices.
  • Keywords
    Aerospace electronics; Aluminum gallium nitride; Gallium nitride; HEMTs; Heterojunctions; Space charge; Threshold voltage; AlGaN/GaN; charge control model (CCM); heterostructure field effect transistor (HFET); threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2252466
  • Filename
    6490040