DocumentCode :
612057
Title :
Welcome to the Entropics: Boot-Time Entropy in Embedded Devices
Author :
Mowery, K. ; Wei, Mu-Hsin ; Kohlbrenner, D. ; Shacham, H. ; Swanson, Stephen
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of California, San Diego, La Jolla, CA, USA
fYear :
2013
fDate :
19-22 May 2013
Firstpage :
589
Lastpage :
603
Abstract :
We present three techniques for extracting entropy during boot on embedded devices. Our first technique times the execution of code blocks early in the Linux kernel boot process. It is simple to implement and has a negligible runtime overhead, but, on many of the devices we test, gathers hundreds of bits of entropy. Our second and third techniques, which run in the bootloader, use hardware features - DRAM decay behavior and PLL locking latency, respectively -- and are therefore less portable and less generally applicable, but their behavior is easier to explain based on physically unpredictable processes. We implement and measure the effectiveness of our techniques on ARM-, MIPS-, and AVR32-based systems-on-a-chip from a variety of vendors.
Keywords :
DRAM chips; Linux; embedded systems; entropy; microprocessor chips; operating system kernels; phase locked loops; system-on-chip; ARM based systems-on-a-chip; AVR32-based systems-on-a-chip; DRAM decay behavior; Linux kernel boot process; MIPS-based systems-on-a-chip; PLL locking latency; boot-time entropy; bootloader; code block execution; embedded devices; entropics; entropy extraction; phase-locked loops; Entropy; Instruments; Kernel; Linux; Random access memory; System-on-chip; Timing; dram; embedded devices; entropy; pll; randomness; timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Security and Privacy (SP), 2013 IEEE Symposium on
Conference_Location :
Berkeley, CA
ISSN :
1081-6011
Print_ISBN :
978-1-4673-6166-8
Electronic_ISBN :
1081-6011
Type :
conf
DOI :
10.1109/SP.2013.46
Filename :
6547135
Link To Document :
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