DocumentCode :
612198
Title :
Design of a FinFET based inverter using MTCMOS and SVL leakage reduction technique
Author :
Manorama ; Khandelwal, Sourabh ; Akashe, Shyam
Author_Institution :
Electron. & Commun. Eng. Dept., ITM Univ., Gwalior, India
fYear :
2013
fDate :
12-14 April 2013
Firstpage :
1
Lastpage :
6
Abstract :
Scaling of the Standard single-gate bulk MOSFETs faces great challenges in the nanometer regime due to the severe short-channel effects that cause an exponential increase in the leakage current and enhanced sensitivity to process variations. Double-gate FinFET has better SCEs performance compared to the conventional CMOS and stimulates technology scaling because of the self-alignment of the two gates. In this paper, we describe different mode of FinFET technology and performed the comparative analysis of stand-by leakage (when the circuit is idle), delay and the total power of the logic circuit, on Cadence Virtuoso tool at 45nm By applying MTCMOS and SVL are effective circuit-level techniques and that provides a high performance and low power design by utilizing both low and high-threshold voltage transistor. The leakage power of the FinFETs based inverter using SVL technique is 50-60% lower than the normal FinFETs based inverter and the total power consumption of FinFETs based inverter using MTCMOS technique is 65-70% lower than the normal FinFETs based inverter.
Keywords :
CMOS logic circuits; MOSFET; integrated circuit design; invertors; leakage currents; low-power electronics; nanoelectronics; threshold logic; Cadence Virtuoso tool; FinFET based inverter design; FinFET technology; MTCMOS; SCE performance; SVL; circuit-level technique; delay; double-gate FinFET; gate self-alignment; high-threshold voltage transistor; leakage power; leakage reduction technique; logic circuit; low power design; low-threshold voltage transistor; nanometer regime; process variation; sensitivity; short-channel effect; single-gate bulk MOSFET; size 45 nm; stand-by leakage; total power; FinFETs; Inverters; Leakage currents; Logic gates; Power demand; FinFETs; High-performance; Independent gate (IG) mode; Low power (LP) mode; Short channel effects (SCEs); Shorted gate (SG) mode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering and Systems (SCES), 2013 Students Conference on
Conference_Location :
Allahabad
Print_ISBN :
978-1-4673-5628-2
Type :
conf
DOI :
10.1109/SCES.2013.6547489
Filename :
6547489
Link To Document :
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