DocumentCode :
612362
Title :
Automatic eye-blink artifact removal method based on EMD-CCA
Author :
Soomro, M.H. ; Badruddin, Nasreen ; Yusoff, Mohd Zuki ; Jatoi, M.A.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Teknol. Petronas, Tronoh, Malaysia
fYear :
2013
fDate :
25-28 May 2013
Firstpage :
186
Lastpage :
190
Abstract :
This research proposes a new hybrid algorithm for automatic removal of eye blink artifact from EEG data based on empirical mode decomposition (EMD) and canonical correlation analysis (CCA). The validity and efficiency of the proposed algorithm is evaluated using correlation coefficient and signal-to-artifact ratio (SAR) and the proposed algorithm is also compared with other popular eye blink artifact removal techniques (CCA, ICA, EMD-ICA) on simulated EEG data of two channels. From the simulation results, the average correlation coefficients for the EEG channels are obtained as 0.908 and 0.864 respectively. The SAR of the EEG signal also improved from 2.2 dB to 6.0 dB after correction using our proposed method. Compared to other eye blink artifact removal techniques, our proposed method has two benefits. Firstly, no visual inspection is required to detect the eye blink artifact components. Secondly, computational assessment of corrected EEG waveforms reveals that the proposed algorithm retrieves the EEG data by removing the eye blink artifacts reliably.
Keywords :
electroencephalography; eye; medical signal processing; statistical analysis; vision; EEG channels; EEG data retrieval; EEG signal; EMD-CCA; SAR; automatic eye-blink artifact removal method; canonical correlation analysis; computational assessment; corrected EEG waveforms; correlation coefficient; electroencephalography; empirical mode decomposition; eye blink artifact component detection; hybrid algorithm; signal-to-artifact ratio; simulated EEG data; Algorithm design and analysis; Correlation; Correlation coefficient; Electroencephalography; Empirical mode decomposition; Inspection; Visualization; Canonical Correlation Analysis (CCA); Correlation Coefficient; Electroencephalography (EEG); Empirical mode decomposition (EMD); Eye Blink artifacts removal; Signal-to-artifact ratio (SAR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Complex Medical Engineering (CME), 2013 ICME International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-2970-5
Type :
conf
DOI :
10.1109/ICCME.2013.6548236
Filename :
6548236
Link To Document :
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