DocumentCode :
61292
Title :
On the Hardness of Adding Nonmasking Fault Tolerance
Author :
Klinkhamer, Alex ; Ebnenasir, Ali
Author_Institution :
Dept. of Comput. Sci., Michigan Technol. Univ., Houghton, MI, USA
Volume :
12
Issue :
3
fYear :
2015
fDate :
May-June 1 2015
Firstpage :
338
Lastpage :
350
Abstract :
This paper investigates the complexity of adding nonmasking fault tolerance, where a nonmasking fault-tolerant program guarantees recovery from states reached due to the occurrence of faults to states from where its specifications are satisfied. We first demonstrate that adding nonmasking fault tolerance to low atomicity programs-where processes have read/write restrictions with respect to the variables of other processes--is NP-complete (in the size of the state space) on an unfair or weakly fair scheduler. Then, we establish a surprising result that even under strong fairness, addition of nonmasking fault tolerance remains NP-hard! The NP-hardness of adding nonmasking fault tolerance is based on a polynomial-time reduction from the 3-SAT problem to the problem of designing self-stabilizing programs from their non-stabilizing versions, which is a special case of adding nonmasking fault tolerance. While it is known that designing self-stabilization under the assumption of strong fairness is polynomial, we demonstrate that adding self-stabilization to non-stabilizing programs is NP-hard under weak fairness.
Keywords :
computability; computational complexity; distributed programming; software fault tolerance; 3-SAT problem; NP-complete problem; NP-hard problem; distributed programs; low atomicity programs; nonmasking fault-tolerant program; nonstabilizing programs; polynomial-time reduction; self-stabilizing programs; strong fairness assumption; Complexity theory; Computational modeling; Convergence; Fault tolerance; Fault tolerant systems; Safety; Transient analysis; Fault tolerance; NP-hardness; distributed programs;
fLanguage :
English
Journal_Title :
Dependable and Secure Computing, IEEE Transactions on
Publisher :
ieee
ISSN :
1545-5971
Type :
jour
DOI :
10.1109/TDSC.2014.2315191
Filename :
6782446
Link To Document :
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