fDate :
April 29 2013-May 2 2013
Abstract :
The following topics are dealt with: analog mixed-signal test; ATPG; ATE architecture; built-in self-test (BIST); fault tolerance; design for testability (DFT); debug; embedded system; FPGA test; hardware security; low-power IC test; microsystems; MEMS; sensor test; memory test; system-on-chip (SOC) test; test standards; test economics; biomedical devices; test quality; reliability; test resource partitioning; SiP test; 3D test; and 2.5D test.
Keywords :
biomedical electronics; design for testability; embedded systems; field programmable gate arrays; low-power electronics; micromechanical devices; mixed analogue-digital integrated circuits; program debugging; reliability; system-on-chip; 2.5D test; 3D test; ATE architecture; ATPG; BIST; DFT; FPGA test; MEMS; SOC test; SiP test; analog mixed-signal test; biomedical devices; built-in self-test; debug; design for testability; embedded system; fault tolerance; hardware security; low-power IC test; memory test; microsystems; reliability; sensor test; system-on-chip test; test economics; test quality; test resource partitioning; test standards;
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4673-5542-1
DOI :
10.1109/VTS.2013.6548869
