DocumentCode
612981
Title
Tracing the best test mix through multi-variate quality tracking
Author
Arslan, B. ; Orailoglu, A.
Author_Institution
Comput. Sci. & Eng., Univ. of California, San Diego, La Jolla, CA, USA
fYear
2013
fDate
April 29 2013-May 2 2013
Firstpage
1
Lastpage
6
Abstract
The increasing multiplicity of defect types forces the inclusion of tests from a variety of fault models. The quest for test quality is checkmated though by the considerable and frequently unnecessary cost of the large number of tests, driven by the lack of a clear correspondence between defects and fault models. While the static derivation of the appropriate test mixes from a variety of fault models to deliver high test quality at low cost is a desirable goal, it is challenged by the frequent changes in defect characteristics. The consequent necessity for adaptivity is addressed in this paper through a test framework that utilizes the continuous stream of failing test data during production testing to track the varying test quality based on evolving defect characteristics and thus dynamically adjust the production test set to deliver a target defect escape level at minimal test cost.
Keywords
fault diagnosis; integrated circuit testing; production testing; best test mix tracing; chip testing; defect characteristics; defect type forces; failing test data; fault model; minimal test cost; multivariate quality tracking; production test set; production testing; target defect escape level; test framework; test inclusion; test mix static derivation; test quality; Accuracy; Adaptation models; Circuit faults; Data models; Estimation; Production; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
978-1-4673-5542-1
Type
conf
DOI
10.1109/VTS.2013.6548886
Filename
6548886
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