Title :
An effective solution for building memory BIST infrastructure based on fault periodicity
Author :
Harutyunyan, G. ; Shoukourian, S. ; Vardanian, V. ; Zorian, Y.
fDate :
April 29 2013-May 2 2013
Abstract :
This paper introduces a new solution for building memory BIST infrastructure, based on rules of fault periodicity and regularity in test algorithms. It is proposed to describe all the periodicity and regularity rules in a form of a special Fault Periodicity Table (FPT) and March Test Template (MTT). FPT allows considering any large number of faults in one table and MTT allows obtaining March tests without using special tools for their generation.
Keywords :
built-in self test; integrated memory circuits; logic testing; FPT; MTT; fault periodicity table; march test template; memory BIST infrastructure; Algorithm design and analysis; Buildings; Built-in self-test; Couplings; Finite element analysis; Heuristic algorithms; Software algorithms; March test; built-in self-test; fault periodicity; symmetry;
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4673-5542-1
DOI :
10.1109/VTS.2013.6548893
