• DocumentCode
    613003
  • Title

    A framework for low overhead hardware based runtime control flow error detection and recovery

  • Author

    Chaudhari, A. ; Junyoung Park ; Abraham, Jibi

  • Author_Institution
    Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Transient errors during execution of a process running on a processor can lead to serious system failures or security lapses. It is necessary to detect, and if possible, correct these errors before any damage is caused to the system. Of the many approaches, monitoring the control flow of an application during runtime is one of the techniques used for transient error detection during an application execution. Although promising, the cost of implementing the control flow checks in software has been prohibitively high and hence is not widely used in practice. In this paper we describe a hardware based control flow monitoring technique which has the capability to detect errors in control flow and the instruction stream being executed on a processor. Our technique achieves a high coverage of control flow error detection (99.98 %) and has the capability to quickly recover from the error, making it resilient to transient control flow errors. It poses an extremely low performance overhead (~ 1 %) and reasonable area cost (<; 6 %) to the host processor. The framework for runtime monitoring of control flow described in this paper can be extended to efficiently monitor and detect any transient errors in the execution of instructions on a processor.
  • Keywords
    multiprocessing systems; system recovery; application execution; control flow monitoring; host processor; overhead hardware; runtime control flow error detection; runtime control flow error recovery; runtime monitoring; transient control flow error; transient error detection; transient error monitoring; Hardware; Monitoring; Pipelines; Process control; Registers; Runtime; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548908
  • Filename
    6548908