DocumentCode
613005
Title
Combining checkpointing and scrubbing in FPGA-based real-time systems
Author
Sari, Ali ; Psarakis, Mihalis ; Gizopoulos, D.
Author_Institution
Dept. of Inf., Univ. of Piraeus, Piraeus, Greece
fYear
2013
fDate
April 29 2013-May 2 2013
Firstpage
1
Lastpage
6
Abstract
SRAM-based FPGAs provide an attractive solution for building high-performance embedded computing systems. Fault tolerant mechanisms are usually implemented in FPGA-based critical systems to improve their vulnerability to transient faults. Most fault tolerant approaches proposed so far in the literature for FPGA systems utilize checkpointing and scrubbing techniques for the fault recovery and repair operations, respectively, and rely on redundancy-based fault detection solutions. In this paper, we study the feasibility of building a low-cost fault-tolerant approach for FPGA-based realtime systems that combines checkpointing and scrubbing, the latter for both fault detection and repair. We calculate the checkpoint frequencies that guarantee the execution of the tasks within their deadlines in the presence of transient faults, taking into consideration the scrubbing time of the FPGA processor. Furthermore, we propose a selective scrubbing approach to reduce the scrubbing time and make feasible the fault tolerant execution of tasks with tight deadlines. We demonstrate the proposed approach in a Leon-3-based SoC in a Virtex-5 FPGA.
Keywords
SRAM chips; embedded systems; fault tolerance; field programmable gate arrays; system-on-chip; FPGA processor; FPGA- based real-time systems; FPGA-based critical systems; Leon-3-based SoC; SRAM-based FPGA; Virtex-5 FPGA; checkpoint frequencies; checkpointing techniques; fault recovery operations; fault repair operations; high-performance embedded computing systems; low-cost fault-tolerant approach; redundancy-based fault detection solutions; scrubbing techniques; selective scrubbing approach; tasks fault tolerant execution; transient faults; Checkpointing; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Real-time systems; Transient analysis; FPGAs; checkpointing; fault tolerance; scrubbing; transient faults;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
978-1-4673-5542-1
Type
conf
DOI
10.1109/VTS.2013.6548910
Filename
6548910
Link To Document