Title :
A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection
Author :
Sen-Wen Hsiao ; Tzou, Nicholas ; Chatterjee, Avhishek
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA
fDate :
April 29 2013-May 2 2013
Abstract :
Reference spur is a nonlinear effect and important specification in PLL for long term jitter. Periodic events of reference clock create a static phase offset between signals. The finite phase offset comes from charge pump mismatch and layout asymmetry. This paper presents a built-in self-test (BIST) circuit applied for PLL static phase offset (SPO) estimation. The proposed circuit takes advantage of an integrator for time-to-voltage conversion (TVC). Along with comparators and counters, a BIST can be constructed for an estimation of mismatch ratio down to 1% over process corners in simulation (10 psec for lnsec pulse width). The calibration can be operated in a closed-loop PLL with lock signal. Additional circuits including delay lines and non-inverting amplifiers are designed for fast calibration. The result shows at least 27 times faster detection speed can be achieved over process corners. The phase offset between PLL reference and feedback signal is essentially the duty cycle difference, and the test is also applied for duty cycle distortion. Related analysis and measurement are included.
Keywords :
built-in self test; calibration; charge pump circuits; circuit layout; clocks; counting circuits; delay lines; feedback amplifiers; jitter; network synthesis; phase comparators; phase estimation; phase locked loops; PLL static phase offset estimation; SPO; TVC; built-in self-test circuit; calibration; charge pump; closed-loop PLL lock signal; comparator; delay line; duty cycle distortion; feedback signal; jitter; layout asymmetry; noninverting amplifier; programmable BIST design; reference clock duty cycle detection; time 1 ns; time 10 ps; time-to-voltage conversion; Built-in self-test; Clocks; Delay lines; Delays; Phase locked loops; Radiation detectors; Steady-state; BIST; PLL; TVC; duty cycle; integrator; mismatch; steady state phase offset;
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4673-5542-1
DOI :
10.1109/VTS.2013.6548912