• DocumentCode
    613015
  • Title

    Special session 8A: McCluskey Doctoral Thesis Award semi-final — presentations

  • Author

    Portolan, M. ; Maniatakos, Michail ; Maniatakos, Michail

  • Author_Institution
    Alcatel-Lucent
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2013 TTTC´s Doctoral Thesis Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. TTTC´s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548920
  • Filename
    6548920