DocumentCode
613015
Title
Special session 8A: McCluskey Doctoral Thesis Award semi-final — presentations
Author
Portolan, M. ; Maniatakos, Michail ; Maniatakos, Michail
Author_Institution
Alcatel-Lucent
fYear
2013
fDate
April 29 2013-May 2 2013
Firstpage
1
Lastpage
1
Abstract
Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2013 TTTC´s Doctoral Thesis Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. TTTC´s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
978-1-4673-5542-1
Type
conf
DOI
10.1109/VTS.2013.6548920
Filename
6548920
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