On the investigation of built-in tuning of RF receivers using on-chip polyphase filters

Author

Haddad, F. ; Rahajandraibe, W. ; Aziza, H. ; Castellani-Coulie, K. ; Portal, J.-M.

Author_Institution

IM2NP, IMT, Aix-Marseille Univ., Marseille, France

fYear

2013

fDate

April 29 2013-May 2 2013

Firstpage

1

Lastpage

6

Abstract

This paper presents a built-in tuning technique in radiofrequency receivers using on-chip polyphase filters. Auto-calibration of the filter resistance values, based on Design-Of-Experiment (DOE) methodology, is proposed. This approach investigates process and temperature monitoring of the frequency band, the image-rejection-ratio (IRR) and the I/Q-accuracy resulting in robust and low-cost solutions.

Keywords

circuit tuning; design of experiments; radio receivers; radiofrequency filters; radiofrequency integrated circuits; DOE methodology; I/Q-accuracy; IRR; auto-calibration; built-in tuning; design-of-experiment methodology; filter resistance values; image-rejection-ratio; on-chip polyphase filters; radiofrequency receivers; temperature monitoring; Monitoring; Radio frequency; Receivers; Resistance; Temperature measurement; Tuning; Wireless communication; Analog and RF test; Built-in tuning; IRR; Polyphase Filter; low-IF receiver;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium (VTS), 2013 IEEE 31st

Conference_Location

Berkeley, CA

ISSN

1093-0167

Print_ISBN

978-1-4673-5542-1

Type

conf

DOI

10.1109/VTS.2013.6548932

Filename

6548932