DocumentCode :
613029
Title :
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling
Author :
Moon, Thomas ; Hyun Woo Choi ; Chatterjee, Avhishek
Author_Institution :
Sch. of ECE, Georgia Tech, Atlanta, GA, USA
fYear :
2013
fDate :
April 29 2013-May 2 2013
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes a new method to reconstruct signal by a monobit receiver based on incoherent subsampling. The proposed method uses a time-variant threshold voltage for the monobit receiver to increase its amplitude resolution. By our methodology, the threshold voltage does not have to be synchronized with the input signal nor the sampling clock of the system. Hardware measurement with FPGA and high-bandwidth clocked-comparators shows that a low-cost multi-channel test is achievable by our method. The hardware measurement results show a square waveform and a sine wave waveform reconstruction.
Keywords :
clocks; comparators (circuits); field programmable gate arrays; integrated circuit testing; signal reconstruction; FPGA; amplitude resolution; hardware measurement; high-bandwidth clocked-comparators; incoherent subsampling; low-cost multichannel testing; monobit receivers; periodic signals; signal reconstruction; sine wave waveform reconstruction; square waveform; time-variant threshold voltage; Clocks; Hardware; Receivers; Signal reconstruction; Signal resolution; Synchronization; Testing; Monobit receiver; analog-to-digital conversion; frequency estimation; incoherent subsampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
978-1-4673-5542-1
Type :
conf
DOI :
10.1109/VTS.2013.6548934
Filename :
6548934
Link To Document :
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