• DocumentCode
    613424
  • Title

    Novel multi-stage simulated annealing for optimal placement of PMUs in conjunction with conventional measurements

  • Author

    Gopakumar, Pathirikkat ; Reddy, Maddikara Jaya Bharata ; Mohanta, Dusmanta Kumar

  • Author_Institution
    Dept. of EEE, Nat. Inst. of Technol., Tiruchurappalli, India
  • fYear
    2013
  • fDate
    5-8 May 2013
  • Firstpage
    248
  • Lastpage
    252
  • Abstract
    Power grid monitoring plays a vital role in stable and secure power transfer from generating stations to customer load points. Incorporation of synchrophasor measurement units like phasor measurement units (PMUs) can enhance the present power grid monitoring system. The high cost of PMUs summons the optimal use of these units to achieve complete observability of the power grid network. This paper presents a novel Multi-Stage Simulated Annealing algorithm for the joint placement of PMUs along with the existing conventional measurement units in the power grid network. The proposed multi-stage optimization method enables Simulated Annealing to reach the optimal point faster than conventional Simulated Annealing methods. The controlled uphill movements during various stages facilitate to obtain best possible solution.
  • Keywords
    load (electric); phasor measurement; power grids; power system security; simulated annealing; PMU optimal placement; customer load point; generating station; multistage simulated annealing algorithm; phasor measurement unit; power grid monitoring system; power grid network; power transfer security; synchrophasor measurement unit; Fluid flow measurement; Measurement units; Observability; Phasor measurement units; Power grids; Power measurement; Optimal Placement; Phasor Measurement Units (PMUs); Simulated Annealing (SA); Western Region Indian Power grid;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2013 12th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-1-4673-3060-2
  • Type

    conf

  • DOI
    10.1109/EEEIC.2013.6549625
  • Filename
    6549625