Abstract :
The following topics are dealt with: multimedia system; cryptography; integrated circuit testing; system-level-design; high-frequency design; CMOS integrated circuit; image processing; robust circuits; RTL design; advanced network subsystems; bus subsystems; circuit calibration; circuit reliability; circuit simulation techniques; and FPGA reconfiguration.
Keywords :
CMOS integrated circuits; calibration; circuit reliability; circuit simulation; cryptography; field programmable gate arrays; image processing; integrated circuit testing; multimedia systems; CMOS integrated circuit; FPGA reconfiguration; bus subsystems; circuit calibration; circuit reliability; circuit simulation techniques; cryptography; high-frequency design; image processing; integrated circuit testing; multimedia system; robust circuits; system-level-design;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location :
Karlovy Vary
Print_ISBN :
978-1-4673-6135-4
Electronic_ISBN :
978-1-4673-6134-7
DOI :
10.1109/DDECS.2013.6549769
