DocumentCode :
613529
Title :
On the on-line functional test of the Reorder Buffer memory in superscalar processors
Author :
Di Carlo, S. ; Sanchez, E. ; Sonza Reorda, M.
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear :
2013
fDate :
8-10 April 2013
Firstpage :
36
Lastpage :
41
Abstract :
The Reorder Buffer (ROB) is a key component in superscalar processors. It enables both in-order commitment of instructions and precise exception management even in those architectures that support out-of-order execution. The ROB architecture typically includes a memory array whose size may reach several thousands of bits. Testing this array may be important to guarantee the correct behavior of the processor. Proprietary BIST solutions typically adopted by manufacturers for end-of-production test are not always suitable for on-line test. In fact, they require the usage of test infrastructures that may be expensive, or may not be accessible and/or documented. This paper proposes an alternative solution, based on a functional approach, which has been validated resorting to both an architectural and a memory fault simulator.
Keywords :
buffer storage; built-in self test; memory architecture; multiprocessing systems; BIST; ROB architecture simulator; built-in self-test techniques; end-of-production test; exception management; instruction commitment; memory array testing; memory fault simulator; online functional test; out-of-order execution; reorder buffer memory; superscalar processors; Built-in self-test; Clocks; Couplings; Out of order; Registers; embedded memory test; microprocessor testing; on-line test; software-based self-test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location :
Karlovy Vary
Print_ISBN :
978-1-4673-6135-4
Electronic_ISBN :
978-1-4673-6134-7
Type :
conf
DOI :
10.1109/DDECS.2013.6549785
Filename :
6549785
Link To Document :
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