DocumentCode
613531
Title
Efficient automated speedpath debugging
Author
Dehbashi, M. ; Fey, Gorschwin
Author_Institution
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear
2013
fDate
8-10 April 2013
Firstpage
48
Lastpage
53
Abstract
Speedpath diagnosis is one of the major challenges in designing high-performance Very-Large-Scale Integrated (VLSI) circuits due to timing variations caused by process variations and environmental effects. In this paper, an efficient approach to automate speedpath debugging is presented. The approach relies on converting the timing behavior of a circuit and its corresponding timing variations into functional domain. Afterwards, a SAT-based debug engine is utilized to extract potential failing speedpaths. The experimental results on ISCAS´85 and ISCAS´89 benchmark suites show that our approach achieves a 63% decrease in the size of model resulting in 54% decrease in the debugging time compared to previous work while having a high diagnosis accuracy.
Keywords
VLSI; integrated circuit design; ISCAS´85 benchmark; ISCAS´89 benchmark; SAT-based debug engine; VLSI circuit design; automated speedpath debugging; circuit timing behavior; environmental effects; functional domain; high-performance very-large-scale integrated circuit design; process variations; speedpath diagnosis; Clocks; Debugging; Delays; Integrated circuit modeling; Logic gates; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549787
Filename
6549787
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