• DocumentCode
    613531
  • Title

    Efficient automated speedpath debugging

  • Author

    Dehbashi, M. ; Fey, Gorschwin

  • Author_Institution
    Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
  • fYear
    2013
  • fDate
    8-10 April 2013
  • Firstpage
    48
  • Lastpage
    53
  • Abstract
    Speedpath diagnosis is one of the major challenges in designing high-performance Very-Large-Scale Integrated (VLSI) circuits due to timing variations caused by process variations and environmental effects. In this paper, an efficient approach to automate speedpath debugging is presented. The approach relies on converting the timing behavior of a circuit and its corresponding timing variations into functional domain. Afterwards, a SAT-based debug engine is utilized to extract potential failing speedpaths. The experimental results on ISCAS´85 and ISCAS´89 benchmark suites show that our approach achieves a 63% decrease in the size of model resulting in 54% decrease in the debugging time compared to previous work while having a high diagnosis accuracy.
  • Keywords
    VLSI; integrated circuit design; ISCAS´85 benchmark; ISCAS´89 benchmark; SAT-based debug engine; VLSI circuit design; automated speedpath debugging; circuit timing behavior; environmental effects; functional domain; high-performance very-large-scale integrated circuit design; process variations; speedpath diagnosis; Clocks; Debugging; Delays; Integrated circuit modeling; Logic gates; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
  • Conference_Location
    Karlovy Vary
  • Print_ISBN
    978-1-4673-6135-4
  • Electronic_ISBN
    978-1-4673-6134-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2013.6549787
  • Filename
    6549787