DocumentCode
613540
Title
A low jitter delay-locked-loop applied for DDR4
Author
Yo-Hao Tu ; Kuo-Hsing Cheng ; Hsiang-Yun Wei ; Hong-Yi Huang
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
fYear
2013
fDate
8-10 April 2013
Firstpage
98
Lastpage
101
Abstract
This work is the demand for a stable and low-jitter synchronous circuit on intra-chip. The operation frequencies of electronic products constantly increase along with the de-velopment and breakthrough of the CMOS process technology. The complexity of design and frequency of clock in memory has also been rapidly increasing. Thus, the reliability of synchronous circuits becomes more and more essential. Dynamic Random Access Memory (DRAM) has progressed to DDR4, reaches data rate 1.6 Gbps - 3.2 Gbps. The stability of clock becomes an essential part of design. This work presents a technique that includes a current-matching charge pump and an on-chip supply regulator in the delay-locked loop (DLL). The design is implemented by TSMC CMOS 1P/9M 90 nm technology with a nominal supply voltage 1.2 V and I/O supply voltage 2.5 V. The input frequency is at 1.6 GHz. Peak to peak jitter is 12.33 ps and RMS jitter is 1.66 ps. The power dissipation of DLL is 15.6 mW and chip area is 0.047 mm2.
Keywords
CMOS memory circuits; DRAM chips; UHF integrated circuits; charge pump circuits; circuit stability; clocks; delay lock loops; integrated circuit design; integrated circuit reliability; jitter; CMOS process technology; DDR4; DLL; DRAM; TSMC CMOS 1P-9M technology; bit rate 1.6 Gbit/s to 3.2 Gbit/s; circuit stability; clock stability; current-matching charge pump; dynamic random access memory; electronic product; frequency 1.6 GHz; low jitter delay-locked-loop; low- jitter synchronous intrachip circuit; nominal I-O supply voltage; on-chip supply regulator; power 15.6 mW; size 90 nm; synchronous circuit reliability; time 1.66 ps; time 12.33 ps; voltage 1.2 V; voltage 2.5 V; Charge pumps; Delays; Jitter; Noise; Random access memory; Synchronization; Voltage control; charge pump (CP); current mismatch; delay-locked loop (DLL); double data rate (DDR); low drop regulator (LDO);
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549796
Filename
6549796
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