Title :
Proton beam characterization at Oslo Cyclotron Laboratory for radiation testing of electronic devices
Author :
Hasanbegovic, A. ; Aunet, Snorre
Author_Institution :
Dept. of Inf., Univ. of Oslo, Oslo, Norway
Abstract :
Proton beam characterization was performed at the Oslo Cyclotron Laboratory (OCL) in order to evaluate the beam properties and asses its usability for radiation testing of electronic devices. The characterization was performed with the aim of establishing good guidelines for reliable radiation tolerance testing at the OCL. A dosimetry measurement and calibration setup is proposed as well as a beam-to-target alignment and beam profile measurement setup. The beam characterization was performed using 30 MeV protons.
Keywords :
CMOS integrated circuits; calibration; cyclotrons; dosimetry; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; low-power electronics; proton beams; proton effects; radiation hardening (electronics); OCL; Oslo Cyclotron Laboratory; beam profile measurement setup; beam property evaluation; beam-to-target alignment; calibration setup; dosimetry measurement; electron volt energy 30 MeV; electronic device; low power CMOS device; proton beam characterization; radiation tolerance testing; reliability; Atmospheric measurements; Particle beam measurements; Particle beams; Particle measurements; Protons; Radiation detectors; Testing;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location :
Karlovy Vary
Print_ISBN :
978-1-4673-6135-4
Electronic_ISBN :
978-1-4673-6134-7
DOI :
10.1109/DDECS.2013.6549805
