DocumentCode
613570
Title
Error resilient OBDDs
Author
Bernasconi, Anna ; Ciriani, Valentina ; Lago, L.
Author_Institution
Dept. of Comput. Sci., Univ. di Pisa, Pisa, Italy
fYear
2013
fDate
8-10 April 2013
Firstpage
246
Lastpage
249
Abstract
Ordered Binary Decision Diagrams (OBDDs) are a widely used data structure for Boolean function manipulation. In particular, OBDDs are commonly used in CAD for the synthesis and verification of integrated circuits. The purpose of this paper is to design an error resilient version of this data structure, i.e., self-repairing OBDDs.We describe some strategies that make reduced OBDDs resilient to errors in the indexes, that are associated to the input variables, or in the edges. The solutions we propose allow to efficiently restore via software the corrupt OBDD without changing the data structure, but rather exploiting its inherent redundancy, as well as the redundancy introduced by its efficient implementations.
Keywords
Boolean functions; binary decision diagrams; data structures; Boolean function manipulation; CAD; data structure; error resilient OBDD; integrated circuit synthesis; integrated circuit verification; ordered binary decision diagram; self-repairing OBDD; Benchmark testing; Binary decision diagrams; Boolean functions; Indexes; Reactive power;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549826
Filename
6549826
Link To Document