DocumentCode :
613570
Title :
Error resilient OBDDs
Author :
Bernasconi, Anna ; Ciriani, Valentina ; Lago, L.
Author_Institution :
Dept. of Comput. Sci., Univ. di Pisa, Pisa, Italy
fYear :
2013
fDate :
8-10 April 2013
Firstpage :
246
Lastpage :
249
Abstract :
Ordered Binary Decision Diagrams (OBDDs) are a widely used data structure for Boolean function manipulation. In particular, OBDDs are commonly used in CAD for the synthesis and verification of integrated circuits. The purpose of this paper is to design an error resilient version of this data structure, i.e., self-repairing OBDDs.We describe some strategies that make reduced OBDDs resilient to errors in the indexes, that are associated to the input variables, or in the edges. The solutions we propose allow to efficiently restore via software the corrupt OBDD without changing the data structure, but rather exploiting its inherent redundancy, as well as the redundancy introduced by its efficient implementations.
Keywords :
Boolean functions; binary decision diagrams; data structures; Boolean function manipulation; CAD; data structure; error resilient OBDD; integrated circuit synthesis; integrated circuit verification; ordered binary decision diagram; self-repairing OBDD; Benchmark testing; Binary decision diagrams; Boolean functions; Indexes; Reactive power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location :
Karlovy Vary
Print_ISBN :
978-1-4673-6135-4
Electronic_ISBN :
978-1-4673-6134-7
Type :
conf
DOI :
10.1109/DDECS.2013.6549826
Filename :
6549826
Link To Document :
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