• DocumentCode
    613715
  • Title

    Power-efficiency study using SPECjEnterprise2010

  • Author

    Oi, H. ; Niboshi, S.

  • Author_Institution
    Univ. of Aizu, Aizu-Wakamatsu, Japan
  • fYear
    2013
  • fDate
    15-18 April 2013
  • Firstpage
    812
  • Lastpage
    817
  • Abstract
    In this paper, we present a case study of the power consumption and performance trade-offs in Java application servers. We use the industry-standard benchmark for the Java application servers, SPECjEnterprise2010, on two platforms with different CPUs, AMD Phenom II and Intel Atom, We investigated the performance and power consumption behaviors against the increasing system size and the relative performance between Phenom vs Atom. Phenom is capable of dynamic frequency scaling (DFS) and we studied the effects of clock frequency control parameters on the performance and power consumption. In terms of the maximum system sizes with valid quality of service (QoS) metrics, Phenom could handle 9.7 times more transactions than Atom. In terms of dynamic power consumption normalized to the system size, Atom was 2.5 times more power-efficient than Phenom. Increasing the sampling rate, one of the DFS parameters, was effective in reducing the power consumption in low load level regions. It reduced the dynamic power up to 7.7 Watt, about 40% lower than the default setting.
  • Keywords
    Java; file servers; frequency control; power aware computing; power consumption; quality of service; AMD Phenom II; CPU; DFS parameters; Intel Atom; Java application servers; QoS metrics; SPECjEnterprise2010; clock frequency control parameters; dynamic frequency scaling; industry-standard benchmark; power consumption; power performance trade-offs; power-efficiency study; quality of service metrics; Atomic clocks; Atomic measurements; Java; Power demand; Servers; Measurement; Performance Evaluation; Power Consumption; SPECjEnterprise2010; Workload Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Conference (SysCon), 2013 IEEE International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4673-3107-4
  • Type

    conf

  • DOI
    10.1109/SysCon.2013.6549977
  • Filename
    6549977