DocumentCode :
614465
Title :
Investigation of the relative sensitivity of control of impulse X-ray television systems
Author :
Mikhailov, S.R. ; Slobodian, N.V. ; Shilo, D.S.
Author_Institution :
Nat. Tech. Univ. of Ukraine “KPI”, Kiev, Ukraine
fYear :
2013
fDate :
16-19 April 2013
Firstpage :
223
Lastpage :
226
Abstract :
Method of calculating the relative sensitivity for X-ray television systems based on X-ray screens, CCD cameras and impulse x-ray devices was proposed. To visualize the images formed by the pulsed X-ray radiation, an adjustable duration of accumulation on the CCD camera was used. The relative sensitivity of the control is determined by the intersection of dependences of the luminance and threshold contrast on the size of the defect. The comparison of calculated and experimental values of the relative sensitivity of control is made in this paper.
Keywords :
CCD image sensors; X-ray detection; X-ray imaging; brightness; nondestructive testing; television; CCD camera; X-ray screen; image visualization; impulse X-ray television system; luminance; nondestructive material testing; pulsed X-ray radiation; relative sensitivity; threshold contrast; Anodes; Cameras; Charge coupled devices; Electron tubes; Materials; Sensitivity; X-ray imaging; adjustable accumulation duration; luminance contrast; monocystalline screen; penetrameter; threshold contrast;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2013 IEEE XXXIII International Scientific Conference
Conference_Location :
Kiev
Print_ISBN :
978-1-4673-4669-6
Type :
conf
DOI :
10.1109/ELNANO.2013.6552043
Filename :
6552043
Link To Document :
بازگشت