Title :
The method of determining the duration of transients in semiconductor devices for current-voltage characteristics measurement
Author :
Iermolenko, Ievgen O. ; Bondarenko, Oleksandr F. ; Iermolenko, Kristina I.
Author_Institution :
Electron. Syst. Dept., Donbas State Tech. Univ., Alchevs´k, Ukraine
Abstract :
The improved method of automatic determining the duration of oscillating transients in semiconductor devices for correct current-voltage characteristics measurement is proposed. This method allows increasing the accuracy of current-voltage characteristics measurement. It is applied in measuring device for current-voltage characteristics analysis.
Keywords :
semiconductor device measurement; semiconductor device testing; transients; current-voltage characteristics measurement; oscillating transients duration; semiconductor devices; Atmospheric measurements; Current measurement; Current-voltage characteristics; Pulse measurements; Semiconductor device measurement; Semiconductor devices; Transient analysis; current-voltage characteristic; measurement; semiconductor device; transient;
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2013 IEEE XXXIII International Scientific Conference
Conference_Location :
Kiev
Print_ISBN :
978-1-4673-4669-6
DOI :
10.1109/ELNANO.2013.6552062
