Title :
A LOG-Induced SSN-Tolerant Transceiver for On-Chip Interconnects in COG-Packaged Source Driver IC for TFT-LCD
Author :
Won-Young Lee ; Jiehwan Oh ; Lee-Sup Kim
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
This brief presents a line-on-glass-induced simultaneous switching noise (SSN)-tolerant transceiver for on-chip interconnects in a chip-on-glass-packaged source driver IC for TFT-LCDs. An SSN compensator generates noise-sensitive bias voltages to maintain the bandwidth of a receiver. With each 10 noise of and , the proposed circuit shows an eye width of 0.542 UI with a bit error rate (BER) of for 2-GB/s PRBS-7 while a conventional repeater shows an eye width of 0.132 UI with a BER of when and noises are injected.
Keywords :
chip scale packaging; compensation; driver circuits; error statistics; integrated circuit interconnections; integrated circuit noise; repeaters; transceivers; BER; COG-packaged source driver IC; GND noises; LOG-induced SSN-tolerant transceiver; SSN compensator; TFT-LCD; VDD noises; bit error rate; chip-on-glass-packaged source driver IC; line-on-glass-induced SSN-tolerant transceiver; line-on-glass-induced simultaneous switching noise-tolerant transceiver; noise-sensitive bias voltages; on-chip interconnects; receiver bandwidth; Bit error rate; Integrated circuit interconnections; Noise; Repeaters; System-on-a-chip; Transceivers; Line-on-glass (LOG); on-chip interconnect; simultaneous switching noise (SSN);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2012.2234892
