DocumentCode :
614929
Title :
Recent advances in memory technology
Author :
James, Doug
Author_Institution :
Chipworks Inc., Ottawa, ON, Canada
fYear :
2013
fDate :
14-16 May 2013
Firstpage :
386
Lastpage :
395
Abstract :
In the last five years we have seen remarkable advances in the density of commodity memory devices, both NAND flash and DRAM. NAND flash has now migrated to the 1x-nm era, and DRAM is has reached the 2x-nm node. To achieve this level of integration the manufacturers have had to adopt both new materials and processes, and also were the first users of advanced lithographic techniques such as immersion lithography and double patterning. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip processes as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural analyses to examine the features and manufacturing processes of the devices. The paper reviews some of the different flash and DRAM memory structures produced recently, and looks at the details of the memory cells.
Keywords :
DRAM chips; flash memories; immersion lithography; semiconductor device manufacture; Chipworks; DRAM; NAND flash; advanced lithographic techniques; commodity memory devices; double patterning; immersion lithography; memory technology; Air gaps; Dielectrics; Flash memories; Logic gates; Metals; Nonvolatile memory; Random access memory; DRAM; embedded memory; flash memory; memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
ISSN :
1078-8743
Print_ISBN :
978-1-4673-5006-8
Type :
conf
DOI :
10.1109/ASMC.2013.6552766
Filename :
6552766
Link To Document :
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