DocumentCode :
614945
Title :
Automation: Key to cycle time improvement in semiconductor manufacturing
Author :
Sonar, Amit ; Shinde, Satyajeet ; Teh, Susanto
Author_Institution :
Diffusion Furnace, GLOBALFOUNDRIES, Malta, NY, USA
fYear :
2013
fDate :
14-16 May 2013
Firstpage :
93
Lastpage :
98
Abstract :
“Cycle Time Drives Everything”. The commitment of product delivery on time is paramount in any industry. It is particularly important in the brutal fast paced semi-conductor manufacturing industry due to tremendous competition in the market. Up until the manufacturing of 200mm wafers, cycle time was largely dependent on the “human” factor. With the advent of 300mm wafers, along with increasing market and customer needs it is hard to imagine semiconductor manufacturing without Factory Automation. In this paper, automation refers to direct equipment control, automated material transportation, and realtime lot dispatching. The paper focuses on implementation of automation on diffusion batch furnaces. Major work was done from the Equipment Interface (EI) perspective along with Real Time Dispatch (RTD) and the furnace software integration. Although the paper focuses on automation based on Tokyo Electron Ltd. (TEL) batch process manufacturing platform, the same logic can be applied to other batch process manufacturing systems. All batch processes as the name suggests process multiple wafers at the same time. A single batch consists of multiple types of wafers namely product wafers, monitor wafers and extra/side dummies (also referred to as fillers) each with a specific function in forming a batch. It is important how these wafers are delivered to the process tools and managed pre/post processing while maintaining safety, efficiency and productivity of the batch tool. An optimized strategy for batch preparation and dispatch showed overall 30% reduction in total dispatch time. A major part of these changes revolved around the filler wafer management which can be sub-divided based on filler wafer process counts and their thickness accumulation. Wait time improvement of 20% is seen on the tool set wh
Keywords :
batch processing (industrial); batch production systems; dispatching; human factors; safety; semiconductor device manufacture; RTD; TEL batch process manufacturing platform; Tokyo Electron Ltd; automated material transportation; automation implementation; batch preparation; batch process manufacturing systems; batch tool efficiency; batch tool productivity; batch tool safety; count-based filler wafers; cycle time improvement; diffusion batch furnaces; direct equipment control; equipment interface; extra-side dummies; filler wafer management; filler wafer process; furnace software integration; human factor; monitor wafers; optimized strategy; pre-post processing management; process tools; product delivery on-time; product wafers; real time dispatch; realtime lot dispatching; semiconductor manufacturing industry; thickness accumulation; total dispatch time; wafer manufacturing; wait time improvement; Automation; Dispatching; Furnaces; Monitoring; Process control; Production facilities; Batch Processing; Cycle Time; Diffusion Furnace Operation; Equipment Interface; Factory Automation; Filler/Dummy wafers; Real Time Dispatch; Wafer Dispatch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
ISSN :
1078-8743
Print_ISBN :
978-1-4673-5006-8
Type :
conf
DOI :
10.1109/ASMC.2013.6552782
Filename :
6552782
Link To Document :
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