Title :
Practical aspects of virtual metrology and predictive maintenance model development and optimization
Author :
Schopka, U. ; Roeder, G. ; Mattes, A. ; Schellenberger, Martin ; Pfeffer, M. ; Pfitzner, Lothar ; Scheibelhofer, P.
Author_Institution :
Fraunhofer Inst. for Integrated Syst. & Device Technol. (IISB), Erlangen, Germany
Abstract :
This paper describes practical aspects of development and implementation of novel process control entities such as Virtual Metrology (VM) and Predictive Maintenance (PdM), which utilize multivariate statistical models and machine learning techniques for prediction of process quality parameters and equipment faults. The description is based on the experiences collected during model development for VM and PdM. An overview of the main development steps including main challenges, potential solutions and applicable algorithms is given. The implementation of the steps is described at the example of the prediction of the filament breakdown in an implanter ion source.
Keywords :
control engineering computing; ion sources; learning (artificial intelligence); maintenance engineering; process control; production engineering computing; statistical analysis; PdM; VM; applicable algorithms; equipment faults; filament breakdown; implanter ion source; machine learning techniques; main challenges; main development steps; multivariate statistical models; potential solutions; predictive maintenance model development; process control entities; process quality parameters; virtual metrology; Data models; Degradation; Maintenance engineering; Noise; Prediction algorithms; Predictive models; Process control; Advanced Process Control; Predictive Maintenance; Virtual Metrology; data mining; machine learning; process control; statistical modeling;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location :
Saratoga Springs, NY
Print_ISBN :
978-1-4673-5006-8
DOI :
10.1109/ASMC.2013.6552793