• DocumentCode
    61504
  • Title

    Suppression of Flicker Noise Up-Conversion in a 65-nm CMOS VCO in the 3.0-to-3.6 GHz Band

  • Author

    Pepe, Federico ; Bonfanti, Andrea ; Levantino, Salvatore ; Samori, Carlo ; Lacaita, Andrea L.

  • Author_Institution
    Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
  • Volume
    48
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2375
  • Lastpage
    2389
  • Abstract
    Flicker noise up-conversion in voltage-biased oscillators can be effectively suppressed by inserting resistances in series to the drain of the transconductor MOSFETs. This solution avoids the degradation of the start-up margin and the adoption of area-demanding resonant filters with proper tuning. This paper presents a detailed theoretical analysis of 1/f noise up-conversion and quantitatively addresses the impact of two major contributions, namely the Groszkowski effect and the loop delay caused by stray capacitances at the drain node of the transistors. A simple flow for the design of an oscillator with suppressed flicker noise up-conversion is presented which is based on first-order closed-form formulas. Finally , theoretical estimates are compared to experimental results on a 65-nm CMOS VCO covering the 3.0-3.6 GHz band.
  • Keywords
    CMOS analogue integrated circuits; MOSFET; interference suppression; microwave integrated circuits; microwave oscillators; voltage-controlled oscillators; 1-f noise; CMOS VCO; Groszkowski effect; drain node; first-order closed-form formulas; flicker noise up-conversion suppression; frequency 3.0 GHz to 3.6 GHz; loop delay; resonant filters; size 65 nm; start-up margin; stray capacitances; transconductor MOSFET; voltage-biased oscillators; Phase noise; Resistors; Topology; Transistors; Voltage-controlled oscillators; Cyclostationary noise; flicker noise; harmonic distortion; impulse sensitivity function (ISF); oscillator nonlinearity; phase noise; voltage-controlled oscillator;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2273181
  • Filename
    6570772